411. Specification for potentiometers of assessed quality: generic data and methods of test. (29th February 1972) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (58 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
412. Rules for the preparation of detail specifications for integrated circuits of assessed quality: voltage regulators. Full assessment level. (15th January 1978) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
413. Specification for quartz crystal units of assessed quality: generic data and methods of test. (29th October 1982) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (38 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
414. Specification for reed contact units of assessed quality: generic data and methods of test. (16th August 1972) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (70 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
415. Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test. (31st October 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (104 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
416. Specification for lever operated switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications. (28th February 1979) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (28 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
417. Rules for the preparation of detail specifications for integrated circuits of assessed quality which perform mixed digital and/or analogue functions. (15th April 1981) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (6 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
418. Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed resistor networks with individually measurable resistors of either different resistance values or different rated dissipations. Assessment level E Part 04.02, (15th July 1984) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
419. Specification for electrical connectors of assessed quality for d.c. and low frequency application: generic data, methods of test and capability approval procedures. (28th February 1983) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (94 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
420. Rules for the preparation of detail specifications for analogue integrated circuits of assessed quality. Full assessment level. (15th April 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (38 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗