1. BS ISO 20890-6.2. Guidelines for in-service inspections for primary coolant circuit components of light water reactors. Part 6. Radiographic testing (4th September 2019) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (53 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Data requirements for semiconductor die. Particular requirements and recommendations for die types. Bare die with added connection structures Part 5-2, (15th June 2001) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Explanation of the mathematical addition of working voltages, insulationbetween circuits, and use of PELV, in TC 34 standards. (25th October 2018) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (24 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. BS EN IEC 60747-15. Semiconductor devices. Part 15. Isolated power semiconductor devices. Discrete devices (5th July 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (55 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗