1. Fringe pattern analysis for optical metrology : theory, algorithms, and applications /: theory, algorithms, and applications. ([2014]) Authors: Servín, Manuel; Quiroga, J. Antonio (Juan Antonio); Padilla, J. Moisés (José Moisés) Record Type: Book Extent: 1 online resource (xvi, 328 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗