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Subject Auger parameter -- chemical state analysis -- HAXPES -- information depth -- Wagner plot

1. Concepts for chemical state analysis at constant probing depth by lab‐based XPS/HAXPES combining soft and hard X‐ray sources. (27th April 2020)

Authors:
Siol, Sebastian; Mann, Jennifer; Newman, John; Miyayama, Takuya; Watanabe, Katsumi; Schmutz, Patrik; Cancellieri, Claudia; Jeurgens, Lars P.H.
Other Names:
Oswald Steffen guestEditor.; Watts John F. guestEditor.; Abel Marie‐Laure guestEditor.
Journal:
Surface and interface analysis
Issue:
Volume 52:Number 12(2020)
Page Start:
802
Record Type:
Journal Article
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