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Subject Atom probe tomography -- characterisation -- microstructure

1. Three-dimensional nanoscale characterisation of materials by atom probe tomography. (17th February 2018)

Authors:
Devaraj, Arun; Perea, Daniel E.; Liu, Jia; Gordon, Lyle M.; Prosa, Ty. J.; Parikh, Pritesh; Diercks, David R.; Meher, Subhashish; Kolli, R. Prakash; Meng, Ying Shirley; Thevuthasan, Suntharampillai
Journal:
International materials reviews
Issue:
Volume 63:Number 2(2018)
Page Start:
68
Record Type:
Journal Article
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