1. Mechanisms and shielding characteristics of alpha particle-induced soft errors in 28 and 40 nm configuration memories of SRAM-based FPGAs. (January 2023) Authors: Luo, Jun-Yang; Zhang, Hong; Zhang, Zhan-Gang; Lei, Zhi-Feng; Guo, Jin-Long; Du, Guang-Hua; Peng, Chao; He, YuJuan; Zhong, Xiang-Li Journal: Microelectronics and reliability Issue: Volume 140(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗