Subject: Adaptive test -- Test pattern -- Linear discriminant analysis (LDA) -- Machine learning (ML) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Subject Adaptive test -- Test pattern -- Linear discriminant analysis (LDA) -- Machine learning (ML)

1. VLSI test through an improved LDA classification algorithm for test cost reduction. (July 2022)

Authors:: Huang, Liang; Song, Tai
Journal:: Microelectronics journal
Issue:: Volume 125(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗