Subject: Accelerated degradation test -- The EM algorithm -- Random effects -- Stress–acceleration relation - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Subject Accelerated degradation test -- The EM algorithm -- Random effects -- Stress–acceleration relation

1. A new class of Wiener process models for degradation analysis. (July 2015)

Authors:: Ye, Zhi-Sheng; Chen, Nan; Shen, Yan
Journal:: Reliability engineering & system safety
Issue:: Volume 139(2015:Jul.)
Page Start:: 58
Record Type:: Journal Article
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