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2. Effect of gate length on breakdown voltage in AlGaN/GaN high-electron-mobility transistor*Project supported by the National Natural Science Foundation of China (Grant Nos. 61334002, 61106106, and 61204085). (20th December 2015)

6. Trap states induced by reactive ion etching in AlGaN/GaN high-electron-mobility transistors*Project supported by the National Natural Science Foundation of China (Grant Nos. 61334002 and 61106106). (12th October 2015)