571. Yield-based process capability indices for nonnormal continuous data. Issue 2 (3rd April 2019) Authors: Chen, Piao; Wang, Bing Xing; Ye, Zhi-Sheng Journal: Journal of quality technology Issue: Volume 51:Issue 2(2019) Page Start: 171 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗