1. Novel scanning system with error separation for high-accuracy profile measurement. (1st January 2023) Authors: Guo, Jingyang; Zhai, Dede; Chen, Shanyong; Liu, Junfeng Journal: Measurement science & technology Issue: Volume 34:Number 1(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗