1. Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. (September 2016) Authors: Choi, Jin Hyung; Yu, Chong Gun; Park, Jong Tae Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 215 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. (September 2016) Authors: Choi, Jin Hyung; Yu, Chong Gun; Park, Jong Tae Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 215 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗