1. Thermal Boundary Resistance in GaN Films Measured by Time Domain Thermoreflectance with Robust Monte Carlo Uncertainty Estimation. Issue 1 (2nd January 2016) Authors: Bougher, Thomas L.; Yates, Luke; Lo, Chien-Fong; Johnson, Wayne; Graham, Samuel; Cola, Baratunde A. Journal: Nanoscale and microscale thermophysical engineering Issue: Volume 20:Issue 1(2016) Page Start: 22 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗