1. A finite-element analysis of in-grain microcracks caused by surface diffusion induced by electromigration. (1st June 2015) Authors: He, Dingni; Huang, Peizhen Journal: International journal of solids and structures Issue: Volume 62(2015) Page Start: 248 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗