1. Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. (August 2018) Authors: Li, Yuanqing; Chen, Li; Nofal, Issam; Chen, Mo; Wang, Haibin; Liu, Rui; Chen, Qingyu; Krstic, Milos; Shi, Shuting; Guo, Gang; Baeg, Sang H.; Wen, Shi-Jie; Wong, Richard Journal: Microelectronics and reliability Issue: Volume 87(2018) Page Start: 24 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗