1. Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors. (November 2017) Authors: de Oliveira Rocha, Raphael; Sill Torres, Frank; Bastos, Rodrigo Possamai Journal: Microelectronics and reliability Issue: Volume 78(2017) Page Start: 190 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗