Journal: Solid-state electronics - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Journal Solid-state electronics

1991. Trigger voltage walk-out phenomenon in SOI lateral insulated gate bipolar transistor under repetitive electrostatic discharge stresses. (May 2016)

Authors:: Zhang, Shifeng; Han, Yan; Ma, Fei
Journal:: Solid-state electronics
Issue:: Volume 119(2016)
Page Start:: 25
Record Type:: Journal Article
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1992. Trigger voltage walk-out phenomenon in SOI lateral insulated gate bipolar transistor under repetitive electrostatic discharge stresses. (May 2016)

Authors:: Zhang, Shifeng; Han, Yan; Ma, Fei
Journal:: Solid-state electronics
Issue:: Volume 119(2016)
Page Start:: 25
Record Type:: Journal Article
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1993. Tunable-Sensitivity flexible pressure sensor based on graphene transparent electrode. (July 2018)

Authors:: Luo, Shi; Yang, Jun; Song, Xuefen; Zhou, Xi; Yu, Leyong; Sun, Tai; Yu, Chongsheng; Huang, Deping; Du, Chunlei; Wei, Dapeng
Journal:: Solid-state electronics
Issue:: Volume 145(2018)
Page Start:: 29
Record Type:: Journal Article
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1994. Tuning of ionization potential in amorphous Cd–In–O thin films. (January 2020)

Authors:: Kim, Minseok; Yanagi, Hiroshi
Journal:: Solid-state electronics
Issue:: Volume 163(2020)
Page Start:
Record Type:: Journal Article
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1995. Tuning the tunneling probability by mechanical stress in Schottky barrier based reconfigurable nanowire transistors. (February 2017)

Authors:: Baldauf, Tim; Heinzig, André; Trommer, Jens; Mikolajick, Thomas; Weber, Walter Michael
Journal:: Solid-state electronics
Issue:: Volume 128(2017)
Page Start:: 148
Record Type:: Journal Article
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1996. Tunneling leakage in ultrashort-channel MOSFETs—From atomistics to continuum modeling. (November 2022)

Authors:: Prentki, Raphaël J.; Harb, Mohammed; Zhou, Chenyi; Philippopoulos, Pericles; Beaudoin, Félix; Michaud-Rioux, Vincent; Guo, Hong
Journal:: Solid-state electronics
Issue:: Volume 197(2022)
Page Start:
Record Type:: Journal Article
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1997. Turn-around of threshold voltage shift in amorphous InGaZnO TFT under positive bias illumination stress. (March 2023)

Authors:: Kim, Juwon; Kim, Hyunjin; Oh, Jungyeop; Choi, Sung-Yool; Park, Hamin
Journal:: Solid-state electronics
Issue:: Volume 201(2023)
Page Start:
Record Type:: Journal Article
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1998. Turn-off failure in multi-finger SOI-LIGBT used for single chip inverter ICs. (November 2017)

Authors:: Zhang, Long; Zhu, Jing; Zhao, Minna; Huang, Xuequan; Chen, Jiajun; Sun, Weifeng; Ding, Desheng
Journal:: Solid-state electronics
Issue:: Volume 137(2017)
Page Start:: 29
Record Type:: Journal Article
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1999. Two dimensional quantum mechanical simulation of low dimensional tunneling devices. (November 2015)

Authors:: Alper, C.; Palestri, P.; Lattanzio, L.; Padilla, J.L.; Ionescu, A.M.
Journal:: Solid-state electronics
Issue:: Volume 113(2015)
Page Start:: 167
Record Type:: Journal Article
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2000. Two methods of tuning threshold voltage of bulk FinFETs with replacement high-k metal-gate stacks. (March 2017)

Authors:: Xu, Miao; Zhu, Huilong; Zhang, Yanbo; Xu, Qiuxia; Zhang, Yongkui; Qin, Changliang; Zhang, Qingzhu; Yin, Huaxiang; Xu, Hao; Chen, Shuai; Luo, Jun; Li, Chunlong; Zhao, Chao; Ye, Tianchun
Journal:: Solid-state electronics
Issue:: Volume 129(2017)
Page Start:: 52
Record Type:: Journal Article
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