1271. Leakage current elimination for Dickson charge pump with a linear regulator. (June 2017) Authors: Lin, Hesheng; Cao, Hongtao; Chen, Zhirong; Chan, Wing Chun; Lee, Wai Kwong; Zhang, Min Journal: Microelectronics journal Issue: Volume 64(2017) Page Start: 29 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
1272. Library based macro-modeling methodology for Through Silicon Via (TSV) arbitrary arrays. Issue 12 (December 2015) Authors: Ali, Karim; Yahya, Eslam; Elrouby, Alaa; Ismail, Yehea Journal: Microelectronics journal Issue: Volume 46:Issue 12 Part A (2015) Page Start: 1291 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
1273. Lifetime prediction and analysis of AlGaN/GaN HEMT devices under temperature stress. (March 2022) Authors: Wang, Baozhu; Zhao, Jinyuan; Zhang, Ming; Yang, Lin; Wang, Jianchao; Hou, Weimin Journal: Microelectronics journal Issue: Volume 121(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
1274. Line-impedance matching and signal conditioning capabilities for high-speed feed-forward voltage-mode transmit drivers. (September 2016) Authors: Abugharbieh, Khaldoon; Balabanyan, Abraham; Durgaryan, Armen; Melikyan, Vazgen Journal: Microelectronics journal Issue: Volume 55(2016) Page Start: 26 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
1275. Line-impedance matching and signal conditioning capabilities for high-speed feed-forward voltage-mode transmit drivers. (September 2016) Authors: Abugharbieh, Khaldoon; Balabanyan, Abraham; Durgaryan, Armen; Melikyan, Vazgen Journal: Microelectronics journal Issue: Volume 55(2016) Page Start: 26 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
1276. Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs. (January 2023) Authors: Huang, Liang; Song, Tai; Jiang, Tiezhen Journal: Microelectronics journal Issue: Volume 131(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
1277. Linearity enhancement in the entire tuning range of CMOS OTA using a new tune compensated source degeneration technique. (August 2017) Authors: Rezaei, Farzan Journal: Microelectronics journal Issue: Volume 66(2017) Page Start: 128 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
1278. Linearity improvement of gm-boosted common gate LNA: Analysis to design. (October 2016) Authors: Sahafi, Ali; Sobhi, Jafar; Koozehkanani, Ziaddin Daei Journal: Microelectronics journal Issue: Volume 56(2016) Page Start: 156 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
1279. LMS-based digital background mismatch calibration technique for SAR ADC. (June 2023) Authors: Wan, Jing; Song, Shida; Liang, Yuhua Journal: Microelectronics journal Issue: Volume 136(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
1280. Load and frequency dependent CMOS dual-mode DC-DC converter. (October 2019) Authors: Lee, Chan-Soo; Kim, Sung-Soo; Yu, Jun-Ho Journal: Microelectronics journal Issue: Volume 92(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗