1. ESD tests on 850 nm GaAs-based VCSELs. (September 2016) Authors: Vanzi, M.; Mura, G.; Marcello, G.; Xiao, K. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 617 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. ESD tests on 850 nm GaAs-based VCSELs. (September 2016) Authors: Vanzi, M.; Mura, G.; Marcello, G.; Xiao, K. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 617 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗