Subject: Capacitor -- Anomaly detection -- Aging model parameter estimation -- Bayesian linear regression / Journal: Microelectronics and reliability - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Subject Capacitor -- Anomaly detection -- Aging model parameter estimation -- Bayesian linear regression Journal Microelectronics and reliability

1. A data-driven method for anomaly detection and aging model parameter estimation of capacitors based on condition monitoring. (November 2022)

Authors:: Lv, Chunlin; Liu, Jinjun; Zhang, Yan
Journal:: Microelectronics and reliability
Issue:: Volume 138(2022)
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Record Type:: Journal Article
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