Is Part Of: Microelectronics and reliability. Volume 131(2022) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 131(2022)

1. A composite SystemC-UVM abstract optimal path selection verification architecture for complex designs. (April 2022)

Authors:: Sharma, Gaurav; Bhargava, Lava; Kumar, V.
Journal:: Microelectronics and reliability
Issue:: Volume 131(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. A fault-tolerant reconfiguration system based on pilot switch for grid-connected inverters. (April 2022)

Authors:: Zhao, Ziyi; Wang, Tianzhen; Benbouzid, Mohamed
Journal:: Microelectronics and reliability
Issue:: Volume 131(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. A novel Bayesian multivariate linear regression model for online state-of-health estimation of Lithium-ion battery using multiple health indicators. (April 2022)

Authors:: Lyu, Zhiqiang; Wang, Geng; Tan, Cao
Journal:: Microelectronics and reliability
Issue:: Volume 131(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. Editorial Board. (April 2022)

Journal:: Microelectronics and reliability
Issue:: Volume 131(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

5. Effects of multi-cracks and thermal-mechanical coupled load on the TSV reliability. (April 2022)

Authors:: Fan, Zhengwei; Chen, Xun; Jiang, Yu; Li, Xingge; Zhang, Shufeng; Wang, Yashun
Journal:: Microelectronics and reliability
Issue:: Volume 131(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

6. Experimental identification and prioritization of design and process parameters on hole fill in mini wave soldering. (April 2022)

Authors:: Seidel, Reinhardt; Ahrens, Thomas; Friedrich, Jürgen; Reinhardt, Andreas; Franke, Jörg
Journal:: Microelectronics and reliability
Issue:: Volume 131(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

7. Interfacial charge analysis and temperature sensitivity of germanium source vertical tunnel FET with delta-doped layer. (April 2022)

Authors:: Vanlalawmpuia, K.; Bhowmick, Brinda
Journal:: Microelectronics and reliability
Issue:: Volume 131(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

8. Microstructure regulation of Sn-3.0Ag-0.5Cu micro-solder joints by hybridizing nano-TiO2. (April 2022)

Authors:: Li, Zhenlong; Cheng, Lanxian; Li, Guoyuan
Journal:: Microelectronics and reliability
Issue:: Volume 131(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

9. Noise behavior and reliability analysis of non-uniform body tunnel FET with dual material source. (April 2022)

Authors:: Talukdar, Jagritee; Rawat, Gopal; Mummaneni, Kavicharan
Journal:: Microelectronics and reliability
Issue:: Volume 131(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

10. Optimal read voltages decision scheme eliminating read retry operations for 3D NAND flash memories. (April 2022)

Authors:: Li, Qianhui; Wang, Qi; Yang, Liu; Yu, Xiaolei; Jiang, Yiyang; He, Jing; Huo, Zongliang
Journal:: Microelectronics and reliability
Issue:: Volume 131(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗