1. Defect generation in a data-storage layer by strong ion bombardment for multilevel non-volatile memory applications. (August 2022) Authors: Park, S.; Seo, T.; Jeon, C.; Lee, Y.K.; Chung, Y. Journal: Materials today nano Issue: Volume 19(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗