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You searched for: Date 2020 Journal Powder diffraction- 620.1127 78
- Materials -- Analysis -- Periodicals 78
- Powder metallurgy -- Periodicals 78
- certification, -- diffractometer, -- lattice parameter, -- Standard Reference Material, -- X-ray diffraction 2
- (BaxSr1−x)2CoWO6, -- crystal structure, -- powder X-ray diffraction patterns, -- semiconductor, -- half-metals 1
- Ag3O, -- Ag2O, -- Ag, -- in situ thermal reaction, -- thermal expansion, -- nonstoichiometry, -- XRPD 1
- Ba2SrTb2CeO9 and Ba1.5Sr1.5Tb1.5Ce1.5O9, -- X-ray powder diffraction, -- electric properties, -- electron paramagnetic resonance, -- X-ray photoelectron spectroscopy 1
- GIXRF, -- XRR, -- thin-film characterization, -- X-ray optics 1
- MOF, -- X-ray powder diffraction, -- crystal structure, -- Rietveld refinement, -- geometry optimization 1
- Nafion, -- PEM, -- electrolyte, -- XAFS, -- laboratory-based XANES 1