1. Determination of Majority Carrier Capture Rates via Deep Level Transient Spectroscopy. (1st January 2016) Authors: Lauwaert, J.; Khelifi, S.; Vrielinck, H. Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 4(2016) Page Start: P3041 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗