1. Improvements in Low Voltage PFIB for Sample Preparation and Large Volume Serial Sectioning Tomography. (August 2020) Authors: van Leer, Brandon; Casalena, Lee; Graham, Jeremy; Winiarski, Bartlomiej Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 898 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Low Energy 500 eV Focused Argon Ion Beam Provided by Multi-Ions Species Plasma FIB for Material Science Sample Preparations. (August 2021) Authors: Jiao, Chengge; Graham, Jeremy; Xu, Xu; Burnett, Timothy; van Leer, Brandon Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 20 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. O+ PFIB Milling and Measurement of FIB Damage in Silicon. (August 2020) Authors: van Leer, Brandon; Casalena, Lee Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 414 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. SIMS Detector on FIB/SEM DualBeam Microscopes for Material Science Applications. (August 2020) Authors: Jiao, Chengge; Xu, Xu; Burnett, Timothy; Dutka, Mikhail; Wall, David; van Leer, Brandon Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 408 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗