1. A review on discoloration and high accelerated testing of optical materials in LED based-products. (February 2018) Authors: Yazdan Mehr, M.; Toroghinejad, M.R.; Karimzadeh, F.; van Driel, W.D.; Zhang, G.Q. Journal: Microelectronics and reliability Issue: Volume 81(2018) Page Start: 136 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Color shift acceleration on mid-power LED packages. (November 2017) Authors: Lu, Guangjun; van Driel, W.D.; Fan, Xuejun; Fan, Jiajie; Qian, Cheng; Zhang, G.Q. Journal: Microelectronics and reliability Issue: Volume 78(2017) Page Start: 294 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Creep fatigue models of solder joints: A critical review. (April 2016) Authors: Wong, E.H.; van Driel, W.D.; Dasgupta, A.; Pecht, M. Journal: Microelectronics and reliability Issue: Volume 59(2016) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Elucidating the large variation in ion diffusivity of microelectronic packaging materials. (September 2022) Authors: Herrmann, A.; van Soestbergen, M.; Erich, S.J.F.; van der Ven, L.G.J.; Huinink, H.P.; van Driel, W.D.; Mavinkurve, A.; De Buyl, F.; Adan, O.C.G. Journal: Microelectronics and reliability Issue: Volume 136(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Exploring water and ion transport process at silicone/copper interfaces using in-situ electrochemical and Kelvin probe approaches. (20th February 2021) Authors: Munirathinam, B.; van Dam, J.P.B.; Herrmann, A.; van Driel, W.D.; De Buyl, F.; Erich, S.J.F.; van der Ven, L.G.J.; Adan, O.C.G.; Mol, J.M.C. Journal: Journal of materials science & technology Issue: Volume 64(2021) Page Start: 203 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Interphase effect on the effective moisture diffusion in epoxy–SiO2 composites. (July 2022) Authors: Herrmann, A.; Erich, S.J.F.; van der Ven, L.G.J.; Huinink, H.P.; van Driel, W.D.; van Soestbergen, M.; Mavinkurve, A.; De Buyl, F.; Fischer, H.R.; Mol, J.M.C.; Adan, O.C.G. Journal: Microelectronics and reliability Issue: Volume 134(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. LED degradation: From component to system. (September 2016) Authors: Hamon, B.; van Driel, W.D. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 599 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. LED degradation: From component to system. (September 2016) Authors: Hamon, B.; van Driel, W.D. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 599 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Lumen maintenance predictions for LED packages. (July 2016) Authors: van Driel, W.D.; Schuld, M.; Jacobs, B.; Commissaris, F.; van der Eyden, J.; Hamon, B. Journal: Microelectronics and reliability Issue: Volume 62(2016) Page Start: 39 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Reliability and diffusion-controlled through thickness oxidation of optical materials in LED-based products. (November 2017) Authors: Yazdan Mehr, M.; Toroghinejad, M.R.; Karimzadeh, F.; van Driel, W.D.; Zhang, G.Q. Journal: Microelectronics and reliability Issue: Volume 78(2017) Page Start: 143 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗