Author/Creator: de Aguiar, Y.Q. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator de Aguiar, Y.Q.

1. Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition. (September 2017)

Authors:: Calienes, W.E.; de Aguiar, Y.Q.; Meinhardt, C.; Vladimirescu, A.; Reis, R.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 655
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology. (September 2017)

Authors:: de Aguiar, Y.Q.; Artola, L.; Hubert, G.; Meinhardt, C.; Kastensmidt, F.L.; Reis, R.A.L.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 660
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗