1. Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity. (24th August 2015) Authors: Zwiebler, M; Hamann-Borrero, J E; Vafaee, M; Komissinskiy, P; Macke, S; Sutarto, R; He, F; Büchner, B; Sawatzky, G A; Alff, L; Geck, J Journal: New journal of physics Issue: Volume 17:Number 8(2015:Aug.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗