1. Total dose effect of Al2O3-based metal–oxide–semiconductor structures and its mechanism under gamma-ray irradiation. (11th October 2018) Authors: Zhu, H P; Zheng, Z S; Li, B; Li, B H; Zhang, G P; Li, D L; Gao, J T; Yang, L; Cui, Y; Liang, C P; Luo, J J; Han, Z S Journal: Semiconductor science and technology Issue: Volume 33:Number 11(2018:Nov.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗