1. An electronic component defect detection method based on SVM. Issue 1 (July 2021) Authors: Zhang, Poxi; Qian, Weiqi; Cai, Hongbin; Lu, Guanghui Journal: Journal of physics Issue: Volume 1982:Issue 1(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗