1. In-situ characterisation of the defect density in reduced graphene oxide under electrical stress using fluorescence microscopy. (26th August 2020) Authors: Zeng, Zequn; Singh, Preetpal; Xiaodai, Sharon Lim; Tan, Cher Ming; Sow, Chorng-Haur Journal: International journal of nanotechnology Issue: Volume 17:Number 1(2020) Page Start: 57 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗