Author/Creator: Zehetbauer, M. / Journal: Microelectronics and reliability - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Zehetbauer, M. Journal Microelectronics and reliability

1. Fatigue testing method for fine bond wires in an LQFP package. (September 2016)

Authors:: Czerny, B.; Mazloum-Nejadari, A.; Khatibi, G.; Weiss, L.; Zehetbauer, M.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 270
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Fatigue testing method for fine bond wires in an LQFP package. (September 2016)

Authors:: Czerny, B.; Mazloum-Nejadari, A.; Khatibi, G.; Weiss, L.; Zehetbauer, M.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 270
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗