Author/Creator: Yu, Chong Gun - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Yu, Chong Gun

1. Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs. Issue 9 (August 2015)

Authors:: Lee, Jae Hoon; Han, Jin-Woo; Yu, Chong Gun; Park, Jong Tae
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1456
Record Type:: Journal Article
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2. Effects of electrode materials on the device performances and instabilities in amorphous InGaZnO thin film transistors. (September 2019)

Authors:: Choi, Jong Won; Park, Sang Hyuk; Yu, Chong Gun; Cho, Won-Ju; Park, Jong Tae
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
Page Start:
Record Type:: Journal Article
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3. Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors. (September 2016)

Authors:: Jang, Hyun Jun; Yu, Chong Gun; Park, Jong Tae
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 570
Record Type:: Journal Article
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4. Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors. (September 2016)

Authors:: Jang, Hyun Jun; Yu, Chong Gun; Park, Jong Tae
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 570
Record Type:: Journal Article
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5. Lifetime prediction of InGaZnO thin film transistor for the application of display device and BEOL-transistors. (April 2018)

Authors:: Kim, Sang Min; Cho, Won Ju; Yu, Chong Gun; Park, Jong Tae
Journal:: Solid-state electronics
Issue:: Volume 142(2018)
Page Start:: 14
Record Type:: Journal Article
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6. Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. (September 2016)

Authors:: Choi, Jin Hyung; Yu, Chong Gun; Park, Jong Tae
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 215
Record Type:: Journal Article
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7. Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. (September 2016)

Authors:: Choi, Jin Hyung; Yu, Chong Gun; Park, Jong Tae
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 215
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗