1. Estimation of the real temperature of samples in IR cell using OH frequency of silica. (7th August 2014) Authors: Yamazaki, H.; Shima, H.; Yoda, E.; Kondo, J. N. Journal: Surface and interface analysis Issue: Volume 47:Number 1(2015) Page Start: 166 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗