Author/Creator: Yang, Wuhua - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Yang, Wuhua

1. Analytical model for the inductive turn-off process of GCT with dynamic avalanche. (May 2021)

Authors:: Yang, Wuhua; Wang, Cailin
Journal:: Microelectronics and reliability
Issue:: Volume 120(2021)
Page Start:
Record Type:: Journal Article
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2. Inhibition of peak electric field shifting on current filaments of high voltage diode. (March 2019)

Authors:: Wang, Cailin; Zhang, Lei; Yang, Jing; Yang, Wuhua; Zhang, Qi
Journal:: Microelectronics and reliability
Issue:: Volume 94(2019)
Page Start:: 13
Record Type:: Journal Article
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3. Limitation of switching-self-clamping-mode "SSCM" in high voltage IGBTs. (May 2019)

Authors:: Wang, Cailin; Yang, Wuhua; Yang, Jing; Zhang, Lei; Zhang, Ruliang
Journal:: Microelectronics and reliability
Issue:: Volume 96(2019)
Page Start:: 1
Record Type:: Journal Article
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4. Ruggedness of Dual-GCT against dynamic avalanche and surge current. (March 2021)

Authors:: Yang, Wuhua; Wang, Cailin; Yang, Jing; Zhang, Qi; Su, Le
Journal:: Microelectronics and reliability
Issue:: Volume 118(2021)
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Record Type:: Journal Article
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5. Study on failure mechanism caused by voltage leap of SGT-MOSFET during UIS testing. (December 2022)

Authors:: Su, Le; Wang, Cailin; Yang, Wuhua; An, Jing
Journal:: Microelectronics and reliability
Issue:: Volume 139(2022)
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Record Type:: Journal Article
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6. Study on formation mechanism of different differential resistance branches at avalanche breakdown curve of SGT-MOSFET. (April 2023)

Authors:: Su, Le; Wang, Cailin; Yang, Wuhua; Zhang, Chao
Journal:: Microelectronics and reliability
Issue:: Volume 143(2023)
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Record Type:: Journal Article
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7. Study on the Characteristics of FSRD with a Corrugated Anode and p+ Adjustment Region at Cathode. Issue 1 (1st November 2022)

Authors:: Wang, Cailin; Yu, Li; Yang, Wuhua; Guan, Lei
Journal:: Journal of physics
Issue:: Volume 2370: Issue 1(2022)
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Record Type:: Journal Article
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8. Study on the destruction mechanism caused by dynamic avalanche in GCTs. (January 2019)

Authors:: Yang, Wuhua; Wang, Cailin; Yang, Jing
Journal:: Microelectronics and reliability
Issue:: Volume 92(2019)
Page Start:: 34
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗