1. State-Transition-Aware Spilling Heuristic for MLC STT-RAM-Based Registers. (22nd November 2017) Authors: Ni, Yuanhui; Gong, Zhiyao; Chen, Weiwen; Yang, Chengmo; Qiu, Keni Other Names: Chen Chien-In Henry Academic Editor. Journal: VLSI design Issue: Volume 2017(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗