1. A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories. (July 2016) Authors: Yamazaki, Senju; Iwasaki, Tomoko Ogura; Hachiya, Shogo; Takahashi, Tomonori; Takeuchi, Ken Journal: Solid-state electronics Issue: Volume 121(2016) Page Start: 25 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories. (July 2016) Authors: Yamazaki, Senju; Iwasaki, Tomoko Ogura; Hachiya, Shogo; Takahashi, Tomonori; Takeuchi, Ken Journal: Solid-state electronics Issue: Volume 121(2016) Page Start: 25 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗