1. A new sensitivity model with blank space for layout optimization*Project supported in part by the National Natural Science Foundation of China (No. 61173088), the Science & Technology Program of Xi'an, China (No. CX1248 ⑤), and the 111 Project (No. B08038). (June 2017) Authors: Wang, Junping; Wu, Yao; Liu, Shigang; Xing, Runsen Journal: Journal of semiconductors Issue: Volume 38:Number 6(2017:Jun.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗