1. Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings /: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings. ([2018]) Editors: Xiao, Bai; Hancock, Edwin R; Ho, Tin Kam; Wilson, Richard C; Biggio, Battista; Robles-Kelly, Antonio Other Names: S+SSPR (Workshop) Record Type: Book Extent: 1 online resource (xiii, 524 pages), 134 illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗