Author/Creator: Wu, You-Lin - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Wu, You-Lin

1. An improved test methodology for detecting one-case latent damage in inverter circuit under ESD pulses. (July 2022)

Authors:: Qing, Yihong; Han, Aoran; Liao, Wenqian; Chen, Le; Yang, Zihan; Du, Feibo; Xie, Tiantian; Wu, You-Lin; Liu, Zhiwei; Kaushik, Brajesh Kumar
Journal:: Microelectronics and reliability
Issue:: Volume 134(2022)
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Record Type:: Journal Article
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2. Characterizations of a nanocomposite biochemical-sensing membrane of γ-APTES incorporated with silica nanoparticles prepared by ultrasonic liquid atomizer spray. (1st October 2021)

Authors:: Liao, Su-Yu; Tsai, Kai-Hsun; Lin, Jing-Jenn; Ching, Congo Tak-Shing; Wu, You-Lin
Journal:: Japanese journal of applied physics
Issue:: Volume 60:Number 10(2021)
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Record Type:: Journal Article
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3. Double-trap model for hysteretic current-voltage characteristics of a polystyrene/ZnO nanorods stacked layer. (November 2017)

Authors:: Wu, You-Lin; Lin, Jing-Jenn; Lin, Shih-Hung; Sung, Yi-Hsing
Journal:: Solid-state electronics
Issue:: Volume 137(2017)
Page Start:: 58
Record Type:: Journal Article
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4. Effect of Biased Neighboring Wire on Polysilicon Wire Biosensors with Sensing Membrane of γ-APTES Mixed with Polydimethylsiloxane-Treated Silica Nanoparticles. (15th February 2021)

Authors:: Liao, Su-Yu; Lin, Jing-Jenn; Ching, Congo Tak-Shing; Wu, You-Lin
Journal:: ECS journal of solid state science and technology
Issue:: Volume 10:Number 2(2021)
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Record Type:: Journal Article
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5. Resistive switching in a metal-insulator-metal device with γ-APTES as the insulator layer. (October 2017)

Authors:: Lin, Jing-Jenn; Lin, Shih-Hung; Wu, You-Lin
Journal:: Solid-state electronics
Issue:: Volume 136(2017)
Page Start:: 86
Record Type:: Journal Article
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6. Study of radiation hardness of HfO2-based resistive switching memory at nanoscale by conductive atomic force microscopy. Issue 11 (November 2015)

Authors:: Lin, Shih-Hung; Wu, You-Lin; Hwang, Yu-Huei; Lin, Jing-Jenn
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 11(2015)
Page Start:: 2224
Record Type:: Journal Article
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