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Author/Creator Wu, San-Lein

1. Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain. (30th March 2014)

Authors:
Tsai, Shih-Chang; Wu, San-Lein; Chen, Jone-Fang; Wang, Bo-Chin; Huang, Po Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Lo, Kun-Yuan; Cheng, Osbert; Fang, Yean-Kuen
Other Names:
Chang Sheng-Po Academic Editor.
Journal:
Journal of nanomaterials
Issue:
Volume 2014(2014)
Page Start:
Record Type:
Journal Article
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