1. Advantages of Helium and Neon Ion Beams for Intelligent Imaging. (August 2014) Authors: Wu, Huimeng; Mcvey, Shawn; Ferranti, David; Huynh, Chuong; Notte, John; Stern, Lewis; Joens, Matthew S.; Fitzpatrick, James A. J; Goetze, Bernhard Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 338 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Advantages of Helium and Neon Ion Beams for Intelligent Imaging. (August 2014) Authors: Wu, Huimeng; Mcvey, Shawn; Ferranti, David; Huynh, Chuong; Notte, John; Stern, Lewis; Joens, Matthew S.; Fitzpatrick, James A. J; Goetze, Bernhard Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 338 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS). (23rd September 2015) Authors: Xia, Deying; Wu, Huimeng; Geotze, Bernhard; Ferranti, David; Stern, Lewis; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1165 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS). (August 2015) Authors: Xia, Deying; Wu, Huimeng; Geotze, Bernhard; Ferranti, David; Stern, Lewis; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1165 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Imaging Contrast with Multiple Ion Beams. (23rd September 2015) Authors: Wu, Huimeng; Sijbrandij, Sybren; McVey, Shawn; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 345 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Imaging Contrast with Multiple Ion Beams. (August 2015) Authors: Wu, Huimeng; Sijbrandij, Sybren; McVey, Shawn; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 701 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Nanocrystals: Pressure‐Tuned Structure and Property of Optically Active Nanocrystals (Adv. Mater. 10/2016). Issue 10 (March 2016) Authors: Bai, Feng; Li, Binsong; Bian, Kaifu; Haddad, Raid; Wu, Huimeng; Wang, Zhongwu; Fan, Hongyou Journal: Advanced materials Issue: Volume 28:Issue 10(2016) Page Start: 1988 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Nanomaterials under stress: A new opportunity for nanomaterials synthesis and engineering. (9th November 2015) Authors: Bai, Feng; Bian, Kaifu; Li, Binsong; Wu, Huimeng; Alarid, Leanne J.; Schunk, Hattie C.; Clem, Paul G.; Fan, Hongyou Journal: MRS bulletin Issue: Volume 40:Number 11(2015:Nov.) Page Start: 961 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Pressure‐Tuned Structure and Property of Optically Active Nanocrystals. Issue 10 (11th January 2016) Authors: Bai, Feng; Li, Binsong; Bian, Kaifu; Haddad, Raid; Wu, Huimeng; Wang, Zhongwu; Fan, Hongyou Journal: Advanced materials Issue: Volume 28:Issue 10(2016) Page Start: 1989 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗