11. New Tools for the Study of Deformed and Heat-Treated Materials via Electron Backscatter Diffraction. (August 2014) Authors: Rampton, Travis M.; Nowell, Matthew M.; Wright, Stuart I. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1482 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
12. Optimizing Reflector Selection for Indexing of EBSD Patterns via Dynamic Pattern Simulation. (August 2019) Authors: Wright, Stuart I.; De Graef, Marc; Singh, Saransh Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 206 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
13. Orientation Precision of Electron Backscatter Diffraction Measurements Near Grain Boundaries. (28th February 2014) Authors: Wright, Stuart I.; Nowell, Matthew M.; de Kloe, René; Chan, Lisa Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 852 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
14. Orientation Precision of Electron Backscatter Diffraction Measurements Near Grain Boundaries. (28th February 2014) Authors: Wright, Stuart I.; Nowell, Matthew M.; de Kloe, René; Chan, Lisa Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 852 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
15. Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns. (27th March 2019) Authors: Wright, Stuart I.; Singh, Saransh; De Graef, Marc Journal: Microscopy and microanalysis Issue: Volume 25:Number 3(2019) Page Start: 675 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
16. Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns. (June 2019) Authors: Wright, Stuart I.; Singh, Saransh; De Graef, Marc Journal: Microscopy and microanalysis Issue: Volume 25:Number 3(2019) Page Start: 675 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗