1. A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization. (12th March 2008) Authors: Rocha, L. A.; Mol, L.; Cretu, E.; Wolffenbuttel, R. F.; Machado da Silva, J. Other Names: Lubaszewski Marcelo Academic Editor. Journal: VLSI design Issue: Volume 2008(2008) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗