1. Benefits of Using a 4 srad XEDS Detector in Quantitative 3D-Compositional Analysis of Core@shell Nanoparticles. (August 2022) Authors: Chen, Qiongyang; Pedrazo-Tardajos, Adrian; Wirix, Maarten; Jiang, Lin; Freitag, Bert; Bals, Sara Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 554 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Combined STEM-EDS tomography of nanowire structures. (17th October 2019) Authors: Bender, Hugo; Richard, Olivier; Kundu, Paromita; Favia, Paola; Zhong, Zhichao; Palenstijn, Willem Jan; Batenburg, Kees Joost; Wirix, Maarten; Kohr, Holger; Schoenmakers, Remco Journal: Semiconductor science and technology Issue: Volume 34:Number 11(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Nanoparticle characterization by automated acquisition and analysis of images and EDS data in the TEM. (August 2021) Authors: Maddalena, Roger; Lemmens, Herman; Rikers, Yuri; Jiang, Lin; Wu, Min; Hukeri, Meghna; Wirix, Maarten Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1810 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗