1. Bayesian approach applied to the Rietveld method. (1st December 2014) Authors: Wiessner, Manfred; Angerer, Paul Journal: Journal of applied crystallography Issue: Volume 47:Part 6(2014:Dec.) Page Start: 1819 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Curvature determination of embedded silicon chips by in situ rocking curve X-ray diffraction measurements at elevated temperatures. Issue 4 (28th September 2016) Authors: Angerer, Paul; Schöngrundner, Ronald; Macurova, Katerina; Wiessner, Manfred; Keckes, Jozef Journal: Powder diffraction Issue: Volume 31:Issue 4(2016) Page Start: 267 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗