Author/Creator: Weide-Zaage, Kirsten - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Weide-Zaage, Kirsten

1. Reliability evaluation of tungsten donut-via as an element of the highly robust metallization. (September 2016)

Authors:: Hein, Verena; Erstling, Marco; Sethu, Raj Sekar; Weide-Zaage, Kirsten; Bai, Tianlin
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 259
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Reliability evaluation of tungsten donut-via as an element of the highly robust metallization. (September 2016)

Authors:: Hein, Verena; Erstling, Marco; Sethu, Raj Sekar; Weide-Zaage, Kirsten; Bai, Tianlin
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 259
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Semiconductor devices in harsh conditions. (2016)

Editors:: Weide-Zaage, Kirsten; Chrzanowska-Jeske, Malgorzata
Record Type:: Book
Extent:: 1 online resource (256 pages), (66 illustrations)
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. Simulation of packaging under harsh environment conditions (temperature, pressure, corrosion and radiation). (September 2017)

Authors:: Weide-Zaage, Kirsten
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 6
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗