1. 21‐2: Highly Reliable Amorphous Indium‐Gallium‐Zinc‐Tin‐Oxide TFTs with Back‐Channel‐Etch Structure. Issue 1 (2nd June 2017) Authors: Lu, Xin-Hong; Wang, Ke; Hu, Hehe; Zhang, Wenlin; Ning, Ce; Yang, Wei; Wang, Jiushi; Yao, Qi; Cao, Zhanfeng; Yuan, Guangcai; Huang, Yinglong Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 291 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. 21‐2: Highly Reliable Amorphous Indium‐Gallium‐Zinc‐Tin‐Oxide TFTs with Back‐Channel‐Etch Structure. Issue 1 (May 2017) Authors: Lu, Xin-Hong; Wang, Ke; Hu, Hehe; Zhang, Wenlin; Ning, Ce; Yang, Wei; Wang, Jiushi; Yao, Qi; Cao, Zhanfeng; Yuan, Guangcai; Huang, Yinglong Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 291 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗