1. Advantages of Low-kV TEM in the Study of Beam Sensitive Materials. (August 2020) Authors: Yaguchi, Toshie; Kilcrease, Jim; Igarashi, Keisuke; Wakui, Akiko; Tamura, Keiji Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 554 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. In situ observation of the deterioration process of sulfide-based solid electrolytes using airtight and air-flow TEM systems. (22nd June 2021) Authors: Tsukasaki, Hirofumi; Igarashi, Keisuke; Wakui, Akiko; Yaguchi, Toshie; Nakajima, Hiroshi; Kimura, Takuya; Sakuda, Atsushi; Tatsumisago, Masahiro; Hayashi, Akitoshi; Mori, Shigeo Journal: Microscopy Issue: Volume 70:Number 6(2021) Page Start: 519 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. PM-30Newly Developed 20–120 kV TEM "HT7800 Series" with the Enhanced Usability. (14th November 2017) Authors: Mise, Hiromi; Wayama, Marina; Wakui, Akiko; Konomi, Mami; Yaguchi, Toshie Journal: Microscopy Issue: Volume 66(2017)Supplement 1 Page Start: i32 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Semiconductor and Soft Material Analysis with Low-kV TEM. (August 2019) Authors: Yaguchi, Toshie; Tamura, Keiji; Kubo, Takashi; Nodera, Yasuyuki; Igarashi, Keisuke; Wakui, Akiko; Kanemura, Takashi; Konomi, Mami Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 456 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗