1. 3D Microstructure Characterization of a Silicon Based Anode Material on Different Length Scales suitable for Storage Applications. (August 2019) Authors: Vorauer, T.; Kumar, P.; Chamasemani, F. F.; Rosc, J.; Fuchsbichler, B.; Koller, S.; Helfen, L.; Jouneau, P.H.; Lyonnard, S.; Brunner, R. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 356 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗